Bluetooth will not likely be used for persistent connections to the lighting

The potential disconnect with the lighting application is the range of Bluetooth technology because it was conceived as a personal-area network, essentially for use within a room, whereas mesh networks such as ZigBee can cover thousands of feet if not a mile.Apparently Kim will utilize Bluetooth primarily for commissioning, or updating, the operating profile of in-grade luminaires once they are installed. For example, you could set the dim level, and even aim the luminaire via deck tilt using a standard Bluetooth-enabled smartphone. Bluetooth will not likely be used for persistent connections to the lighting.Meanwhile, Hubbell brands collected two wins at the Agent of high bay Innovation awards announced Tuesday morning prior to the exhibits opening, and one of those had a controls angle as well. In the category of controls, building integration, site automation and distribution systems, Hubbell Building Automation’s WASP2 Dimming Outdoor Occupancy Sensor was named the category winner over products such as Lutron's EcoSystem technology and Philips Color Kinetics IntelliPower system.

In the recessed downlights category, the Kurt Versen MultiSource fixture won the category. The fixture family offers the flexibility of using different types of lamps ranging from PAR to MR16 with either LED-based lamps or legacy bulbs."Hubbell Lighting is known for producing best-in-class downlights and lighting control technologies -- winning this year’s LIGHTFAIR International Innovation Awards in these two categories is a true testament of our leadership in these areas," said Scott Muse, President of Hubbell Lighting.KLA-Tencor Corporation announced NanoPoint, a new family of patented technologies for its 2900 Series defect inspection system. NanoPoint represents an entirely new way to discover and monitor defects, at optical speed and on existing optical defect inspection equipment. NanoPoint's value has already been demonstrated on early metal layers, where line-edge roughness (LER) on dense pattern had previously limited the ability to detect tiny yield-killing defects inline at advanced nodes.


Our customers are highly motivated to continue to extend optical inline defect inspection beyond the 20nm node," said Keith Wells, vice president and general manager of the Wafer Inspection (WIN) Division at Wholesale Led high bay light. "They want the speed and baseline preservation that only optical inspection can provide—and our challenge is to design equipment that can discover defects whose size is further and further below the inspection wavelength. In the past we have offered various improvements to the light source, optics and other subsystems, but NanoPoint addresses the issue from a new angle. Based on customer feedback, I believe that NanoPoint is a breakthrough technology with the potential for applicability across a broad range of layers and process modules.

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