light emission to help unlock the secrets of this amazing alloy

The researchers combined the leading STEM techniques with high-resolution electron energy loss spectroscopy (EELS), which measured the energy lost by electrons as they passed through the sample. Post-doctoral researchers Kamal Baloch of MIT -- the lead author of the study -- and Aaron Johnston-Peck of CFN actually applied these imaging techniques to the same samples that first launched the controversy over clustering, helping further settle the issue.We found that the indium-rich clusters do not actually exist in these samples, even though they remain efficient light emitters," Baloch said. "While clustering may still occur in other samples, which may be prepared in different ways, the important point is that we've established a foolproof method for investigating led high bay light materials. We can use these non-destructive imaging techniques to explore the fundamental relationship between cluster formation and light emission to help unlock the secrets of this amazing alloy.
Beyond the advanced imaging instruments, researchers used the expertise of Brookhaven Lab physicist Kim Kisslinger, who specializes in nanoscale sample preparation. The InGaN samples were reduced to a thickness of just 20 nanometers, an essential step in priming the materials for STEM and EELS experimentation. The samples were also painstakingly cleaned and polished to eliminate artifacts that might impact image resolution.The research was supported by the Center for Excitonics, an Energy Frontier Research Center funded by the U.S. Department of Energy's Office of Science. The work at Brookhaven Lab's Center for Functional Nanomaterials was also supported by DOE's Office of Science, with additional work carried out at the MIT Center for Materials Science Engineering.

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